データシート - 三次元測定機用製品

資料一覧

• Leaflet: ACR1 / ACR3 / FCR25 port replacement [en]
  

  Leaflet: ACR1 / ACR3 / FCR25 port replacement

  Renishaw racks allow fast repeatable exchanging of probes and styli without the need for manual intervention. This leaflet covers the replacement of ports for ACR1, ACR3 and FCR25 racks.

  [584kB]
• Leaflet: ACR3 with powered port - power supply addendum [en]
  

  Leaflet: ACR3 with powered port - power supply addendum

  No description available

  [43kB]
• Data sheet: ACR3 autochange rack (H-1000-2024) [en]
  

  Data sheet: ACR3 autochange rack (H-1000-2024)

  Renishaw’s ACR3 is mounted within the CMM’s working envelope and facilitates fast, automatic probe exchange without the need for probe re-qualification. In addition, the ACR3 provides covered storage for probes and extension bars. The ACR3 is a passive rack and installation is cable-free allowing straightforward set-up of the rack.

  [416kB]
• Data sheet: AM2 adjustment module (H-1000-2051) [en]
  

  Data sheet: AM2 adjustment module (H-1000-2051)

  The AM2 adjustment module is designed to provide quick and accurate angular alignment of the PH10MQ PLUS motorised probe head with the axes of the co-ordinate measuring machine and / or the autochange rack.

  [81kB]
• Leaflet: High speed communications cable wiring instructions [en]
  

  Leaflet: High speed communications cable wiring instructions

  Instruction leaflet outlining wiring the Renishaw orange high speed communications cable

  [164kB]
• Leaflet: Renishaw sensors for FARO's Quantum Arm [en]
  

  Leaflet: Renishaw sensors for FARO's Quantum Arm

  Leaftlet describing the benefits of the TP20 and the FARO SENSOR for use with a Quantum FARO portable arm

  [165kB]
• Leaflet: Repair leaflet: MCU E-STOP [en]
  

  Leaflet: Repair leaflet: MCU E-STOP

  Information leaflet outlining the procedure for repairing the MCU E-STOP

  [406kB]
• Leaflet: MCU docking plate [en]
  

  Leaflet: MCU docking plate

  No description available

  [113kB]
• Flyer: MH20 articulating probe head [en]
  

  Flyer: MH20 articulating probe head

  MH20 is a compact, infinitely adjustable manual probe head offering maximum flexibility in probe orientation. It can be installed on new and existing measuring machines via shank mounting, and is best suited to manual CMMs.

  [67kB]
• Data sheet: MH20 and MH20i [en]
  

  Data sheet: MH20 and MH20i

  MH20 and MH20i data sheet

  [1.3MB]
• Flyer: MH20i indexing probe head [en]
  

  Flyer: MH20i indexing probe head

  MH20i manual indexing probe head flyer

  [308kB]
• Leaflet: User's leaflet: MRS heavy duty legs [en]
  

  Leaflet: User's leaflet: MRS heavy duty legs

  Where an MRS installation has numerous SCP80s containing heavy stylus arrangements, or vertical stylus arrangements exceeding 190 mm, it is recommended that the optional MRS heavy duty leg kits are used to provide additional rigidity/height. These kits can be purchased separately to match the number of legs used on the MRS.

  [211kB]
• Leaflet: User's leaflet: MRS adjustable footplates [en]
  

  Leaflet: User's leaflet: MRS adjustable footplates

  The MRS rail can be placed at different heights from the CMM’s bed by using multiple MRS legs to provide the required clearance for long styli and extension bars. By using the optional MRS adjustable footplates shown below, the MRS rail can also be placed at different positions on the CMM’s bed thereby ensuring that a maximised working volume can be achieved.

  [111kB]
• Leaflet: MRS2 [en]
  

  Leaflet: MRS2

  No description available

  [64kB]
• Flyer: PH10 PLUS motorised probe head range [en]
  

  Flyer: PH10 PLUS motorised probe head range

  No description available

  [264kB]
• Flyer: PH10M-iQ PLUS [en]
  

  Flyer: PH10M-iQ PLUS

  PH10M-iQ PLUS – Less time calibrating, more time measuring

  [591kB]
• Data sheet: PH20 (H-1000-2059) [en]
  

  Data sheet: PH20 (H-1000-2059)

  PH20 is a dynamic measuring probe head which delivers a 3-fold increase in measurement throughput whilst maintaining high system accuracy.

  [906kB]
• Leaflet: PHC10-3 switch settings [en]
  

  Leaflet: PHC10-3 switch settings

  No description available

  [88kB]
• Leaflet: PHC10-3 card [en]
  

  Leaflet: PHC10-3 card

  Installation leaflet showing the installation of cards in to PHC10-3

  [845kB]
• Leaflet: RCP repair kit [en]
  

  Leaflet: RCP repair kit

  No description available

  [309kB]
• Leaflet: REVO head kit [en]
  

  Leaflet: REVO head kit

  No description available

  [173kB]
• Leaflet: REVO probe kits [en]
  

  Leaflet: REVO probe kits

  No description available

  [317kB]
• Flyer: REVO-2 and RSP2 probes [en]
  

  Flyer: REVO-2 and RSP2 probes

  REVO-2 is the only scanning system for CMMs that simultaneously controls the motion of three machine and two head axes whilst collecting work piece data using its range of 2D and 3D tactile probes, surface roughness measurement probe and now non-contact vision probe too.

  [351kB]
• Flyer: RSP3-1 to RSP3-4 probes for REVO-2 [en]
  

  Flyer: RSP3-1 to RSP3-4 probes for REVO-2

  The RSP3 range is used for 3-axis scanning with fixed REVO-2 head angles during measurement. Each probe is designed to provide optimised accuracy and contact force over a specified stylus range. Consequently, the RSH3 stylus holders are intended for use only with their respective RSP3 probe.

  [268kB]
• Flyer: RSP3-6 extended reach probe [en]
  

  Flyer: RSP3-6 extended reach probe

  The RSP3-6 provides enhanced capability for accessing deep bores and inspecting features within large parts. It is available with a range of stylus holders for applications requiring straight and cranked extensions and can be used for both touch-trigger and 2D scanning applications.

  [421kB]
• Flyer: RTP20 [en]
  

  Flyer: RTP20

  The RTP20 is a compact probe head with DCC capability and integral TP20 touch-trigger probe.

  [228kB]
• フライヤー: RUP1 超音波プローブ
  

  フライヤー: RUP1 超音波プローブ

  超音波による厚さ検査可能な RUP1 超音波プローブで、三次元測定 機用 REVO® 5 軸測定システムのマルチセンサー機能が拡充

  [498kB]
• Flyer: RVP vision probe for REVO-2 [en]
  

  Flyer: RVP vision probe for REVO-2

  RVP further expands the range of applications for the REVO-2 system with a non-contact edge detecting sensor automatically interchangeable with all other REVO probe options. As a result, the system provides the optimum tool to measure multiple features, and a wider variety of parts can be inspected.

  [2.7MB]
• Flyer: ACM angle change mirror for RVP REVO vision probe [en]
  

  Flyer: ACM angle change mirror for RVP REVO vision probe

  No description available

  [700kB]
• Leaflet: SCP600 stylus change port [en]
  

  Leaflet: SCP600 stylus change port

  The stylus change port (SCP600) is a modular system, designed to allow automatic stylus changing on a CMMs, for the SP600 analogue probe.

  [148kB]
• Data sheet: SFM-A1 (H-1000-2290) [en]
  

  Data sheet: SFM-A1 (H-1000-2290)

  Enhanced access and inspection capability for integrated surface finish measurement

  [175kB]
• Data sheet: SFM-A2 (H-1000-2291) [en]
  

  Data sheet: SFM-A2 (H-1000-2291)

  Enhanced access and inspection capability for integrated surface finish measurement

  [197kB]
• Data sheet: SFM-B1 (H-1000-2295) [en]
  

  Data sheet: SFM-B1 (H-1000-2295)

  Enhanced access and inspection capability for integrated surface finish measurement

  [164kB]
• Data sheet: SFM-B2 (H-1000-2296) [en]
  

  Data sheet: SFM-B2 (H-1000-2296)

  Enhanced access and inspection capability for integrated surface finish measurement.

  [204kB]
• Data sheet: SFM-B3 (H-1000-2297) [en]
  

  Data sheet: SFM-B3 (H-1000-2297)

  Enhanced access and inspection capability for integrated surface finish measurement

  [166kB]
• Data sheet: SFM-B4 (H-1000-2298) [en]
  

  Data sheet: SFM-B4 (H-1000-2298)

  Enhanced access and inspection capability for integrated surface finish measurement

  [200kB]
• Data sheet: SFM-B5 [en]
  

  Data sheet: SFM-B5

  Enhanced access and inspection capability for integrated surface finish measurement

  [187kB]
• Data sheet: SFM-C3 (H-1000-2129) [en]
  

  Data sheet: SFM-C3 (H-1000-2129)

  Enhanced access and inspection capability for integrated surface finish measurement

  [163kB]
• Data sheet: SFM-D1 (H-1000-2305) [en]
  

  Data sheet: SFM-D1 (H-1000-2305)

  Enhanced access and inspection capability for integrated surface finish measurement

  [163kB]
• Data sheet: SFM-E1 (H-1000-2310) [en]
  

  Data sheet: SFM-E1 (H-1000-2310)

  Enhanced access and inspection capability for integrated surface finish measurement

  [160kB]
• Data sheet: SFM-E2 (H-1000-2311) [en]
  

  Data sheet: SFM-E2 (H-1000-2311)

  Enhanced access and inspection capability for integrated surface finish measurement

  [164kB]
• Data sheet: SFM-G1 (H-1000-2131) [en]
  

  Data sheet: SFM-G1 (H-1000-2131)

  Enhanced access and inspection capability for integrated surface finish measurement

  [162kB]
• Data sheet: SFM-H1 (H-1000-2132) [en]
  

  Data sheet: SFM-H1 (H-1000-2132)

  Enhanced access and inspection capability for integrated surface finish measurement

  [170kB]
• フライヤー: SFP2 表面粗さプローブ
  

  フライヤー: SFP2 表面粗さプローブ

  SFP2 は REVO®システムの測定能力を拡張するプローブです。SFP2 を導入することで、タッチトリガー測定、高速接触式スキャニング測定、非接触式画像測定に加え、表面粗さ測定も 1 台の三次元測定機上で実施できるようになります。

  [333kB]
• Flyer: Calibration and capability artefacts for SFP2 surface finish probe [en]
  

  Flyer: Calibration and capability artefacts for SFP2 surface finish probe

  Surface finish measurement has traditionally involved the use of hand-held sensors or has required the part to be moved onto a costly dedicated measuring machine. The SFP2 probe for the REVO® 5-axis system changes all this, making surface finish inspection an integral part of CMM measurement, enabling the automatic switching between scanning, optical non-contact and surface finish measurement probe types.

  [606kB]
• Leaflet: SH80K - for SP80 probes supplied before Oct 2007 [en]
  

  Leaflet: SH80K - for SP80 probes supplied before Oct 2007

  SH80K installation leaflet for SP80 probes supplied before Oct 2007

  [333kB]
• Flyer: SP25M compact scanning probe system [en]
  

  Flyer: SP25M compact scanning probe system

  New additions to the SP25 family enhance the range of applications The SP25M is two sensors in one, and has unrivalled flexibility due to the system’s modularity. Users can scan for form, position, and size but also take high accuracy discrete points by using a dedicated scanning module or, alternatively, use an adaptor to carry Renishaw’s TP20 range of touch‑trigger probe modules.

  [361kB]
• Flyer: SP600Q in-quill scanning probe [en]
  

  Flyer: SP600Q in-quill scanning probe

  SP600Q in-quill scanning probe flyer

  [113kB]
• Flyer: SP80 ultra-high accuracy scanning probe [en]
  

  Flyer: SP80 ultra-high accuracy scanning probe

  The SP80 quill mounted probe provides class-leading scanning performance, as well as the most flexible use of styli for maximum productivity.

  [267kB]
• Data sheet: SP80 ultra-high accuracy scanning probe (H-1000-2125) [en]
  

  Data sheet: SP80 ultra-high accuracy scanning probe (H-1000-2125)

  The SP80 quill mounted probe provides class-leading scanning performance, as well as the most flexible use of styli for maximum productivity.

  [267kB]
• Leaflet: SPA2-2 / REVO E-STOP modification leaflet [en]
  

  Leaflet: SPA2-2 / REVO E-STOP modification leaflet

  No description available

  [1.3MB]
• Data sheet: TCR20 (H-1000-1371) [en]
  

  Data sheet: TCR20 (H-1000-1371)

  Based on the industry standard range of MCR20 rack systems, TCR20 securely stores modules for rapid automatic changing, protecting mating surfaces from any airborne contaminants within the working envelope of the machine.

  [417kB]
• Flyer: TP20 touch trigger probe system [en]
  

  Flyer: TP20 touch trigger probe system

  TP20 touch trigger probe system flyer

  [298kB]
• Flyer: TP200 precision touch trigger probe [en]
  

  Flyer: TP200 precision touch trigger probe

  High precision TTP with stylus module changing - The TP200 was developed for tightly toleranced workpieces, and where access to features requires long or complex stylus arrangements.

  [391kB]
• Data sheet: TP200 precision touch-trigger probe system with stylus changer (H-1000-2130) [en]
  

  Data sheet: TP200 precision touch-trigger probe system with stylus changer (H-1000-2130)

  TP200 is an electronic probe using strain gauge technology which gives higher accuracy than kinematic touch-trigger probes. TP200 combines outstanding metrology performance with superior functionality to produce a highly versatile DCC CMM probing system with excellent productivity.

  [194kB]
• Leaflet: Trigger force gauge guide [en]
  

  Leaflet: Trigger force gauge guide

  Trigger force is the amount of pressure applied by the helical compression spring onto the pivotal plate and bearing points to hold the stylus mount in place.

  [63kB]
• Leaflet: UCC daughtercards [en]
  

  Leaflet: UCC daughtercards

  No description available

  [54kB]
• Data sheet: Universal datum sphere (H-1000-2250) [en]
  

  Data sheet: Universal datum sphere (H-1000-2250)

  The Renishaw universal datum sphere enhances the performance of manual and fully automated co-ordinate measuring machines

  [323kB]
• Leaflet: Upgrade brackets and blanking plates [en]
  

  Leaflet: Upgrade brackets and blanking plates

  This leaflet details the bracket options available when upgrading or replacing Renishaw controllers and / or probe interfaces. By using a combination of the following brackets and / or blanking panels, any combination of existing and new Renishaw product can be mounted together inside a 19 inch cabinet rack. The bracket kits shown in this leaflet are supplied with all the necessary fixtures.

  [147kB]