Data sheets - CMM products

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• Leaflet: ACR1 / ACR3 / FCR25 port replacement
  

  Leaflet: ACR1 / ACR3 / FCR25 port replacement

  Renishaw racks allow fast repeatable exchanging of probes and styli without the need for manual intervention. This leaflet covers the replacement of ports for ACR1, ACR3 and FCR25 racks.

  [584kB]
• Leaflet: ACR3 with powered port - power supply addendum
  

  Leaflet: ACR3 with powered port - power supply addendum

  No description available

  [43kB]
• Data sheet: ACR3 autochange rack (H-1000-2024)
  

  Data sheet: ACR3 autochange rack (H-1000-2024)

  Renishaw’s ACR3 is mounted within the CMM’s working envelope and facilitates fast, automatic probe exchange without the need for probe re-qualification. In addition, the ACR3 provides covered storage for probes and extension bars. The ACR3 is a passive rack and installation is cable-free allowing straightforward set-up of the rack.

  [416kB]
• Data sheet: AM2 adjustment module (H-1000-2051)
  

  Data sheet: AM2 adjustment module (H-1000-2051)

  The AM2 adjustment module is designed to provide quick and accurate angular alignment of the PH10MQ PLUS motorised probe head with the axes of the co-ordinate measuring machine and / or the autochange rack.

  [81kB]
• Leaflet: High speed communications cable wiring instructions
  

  Leaflet: High speed communications cable wiring instructions

  Instruction leaflet outlining wiring the Renishaw orange high speed communications cable

  [164kB]
• Leaflet: Renishaw sensors for FARO's Quantum Arm
  

  Leaflet: Renishaw sensors for FARO's Quantum Arm

  Leaftlet describing the benefits of the TP20 and the FARO SENSOR for use with a Quantum FARO portable arm

  [165kB]
• Leaflet: Repair leaflet: MCU E-STOP
  

  Leaflet: Repair leaflet: MCU E-STOP

  Information leaflet outlining the procedure for repairing the MCU E-STOP

  [406kB]
• Leaflet: MCU docking plate
  

  Leaflet: MCU docking plate

  No description available

  [113kB]
• Flyer: MH20 articulating probe head
  

  Flyer: MH20 articulating probe head

  MH20 is a compact, infinitely adjustable manual probe head offering maximum flexibility in probe orientation. It can be installed on new and existing measuring machines via shank mounting, and is best suited to manual CMMs.

  [67kB]
• Data sheet: MH20 and MH20i
  

  Data sheet: MH20 and MH20i

  MH20 and MH20i data sheet

  [1.3MB]
• Flyer: MH20i indexing probe head
  

  Flyer: MH20i indexing probe head

  MH20i manual indexing probe head flyer

  [308kB]
• Leaflet: User's leaflet: MRS heavy duty legs
  

  Leaflet: User's leaflet: MRS heavy duty legs

  Where an MRS installation has numerous SCP80s containing heavy stylus arrangements, or vertical stylus arrangements exceeding 190 mm, it is recommended that the optional MRS heavy duty leg kits are used to provide additional rigidity/height. These kits can be purchased separately to match the number of legs used on the MRS.

  [211kB]
• Leaflet: User's leaflet: MRS adjustable footplates
  

  Leaflet: User's leaflet: MRS adjustable footplates

  The MRS rail can be placed at different heights from the CMM’s bed by using multiple MRS legs to provide the required clearance for long styli and extension bars. By using the optional MRS adjustable footplates shown below, the MRS rail can also be placed at different positions on the CMM’s bed thereby ensuring that a maximised working volume can be achieved.

  [111kB]
• Leaflet: MRS2
  

  Leaflet: MRS2

  No description available

  [64kB]
• Flyer: PH10 PLUS motorised probe head range
  

  Flyer: PH10 PLUS motorised probe head range

  No description available

  [264kB]
• Flyer: PH10M-iQ PLUS
  

  Flyer: PH10M-iQ PLUS

  PH10M-iQ PLUS – Less time calibrating, more time measuring

  [591kB]
• Data sheet: PH20 (H-1000-2059)
  

  Data sheet: PH20 (H-1000-2059)

  PH20 is a dynamic measuring probe head which delivers a 3-fold increase in measurement throughput whilst maintaining high system accuracy.

  [906kB]
• Leaflet: PHC10-3 switch settings
  

  Leaflet: PHC10-3 switch settings

  No description available

  [88kB]
• Leaflet: PHC10-3 card
  

  Leaflet: PHC10-3 card

  Installation leaflet showing the installation of cards in to PHC10-3

  [845kB]
• Leaflet: RCP repair kit
  

  Leaflet: RCP repair kit

  No description available

  [309kB]
• Leaflet: REVO head kit
  

  Leaflet: REVO head kit

  No description available

  [173kB]
• Leaflet: REVO probe kits
  

  Leaflet: REVO probe kits

  No description available

  [317kB]
• Scheda informativa: Sonde REVO-2 e RSP2 [it]
  

  Scheda informativa: Sonde REVO-2 e RSP2

  REVO-2 è l'unico sistema di scansione per CMM in grado di controllare simultaneamente il movimento di tre assi macchina e di due assi della testa, mentre acquisisce dati sul pezzo di lavoro tramite sonde a contatto 2D e 3D, sonde per la misura della ruvidità della superficie e, da oggi, anche sonde di visione senza contatto.

  [352kB]
• Scheda informativa: Sonde da RSP3-1 a RSP3-4 per REVO-2 [it]
  

  Scheda informativa: Sonde da RSP3-1 a RSP3-4 per REVO-2

  La serie RSP3 viene utilizzata per scansioni su 3 assi, ad esempio con un'angolazione fissa della testa REVO-2 durante la misura. Ciascuna sonda è stata studiata per garantire un livello ottimale di accuratezza e forza di contatto con una precisa gamma di stili. Di conseguenza, i portastilo RSH3 sono progettati per adattarsi unicamente alle rispettive sonde RSP3.

  [268kB]
• Scheda informativa: RSP3-6 - sonde a portata estesa [it]
  

  Scheda informativa: RSP3-6 - sonde a portata estesa

  RSP3-6 fornisce una maggiore capacità di ispezionare fori profondi ed elementi posti all'interno di pezzi di grandi dimensioni. È disponibile con una serie di portastili per le applicazioni che richiedono prolunghe diritte o a gomito, e può essere utilizzata sia nel caso di ispezioni di punti singoli a contatto che per scansioni 2D.

  [421kB]
• Scheda informativa: Testa compatta per sonde RTP20 [it]
  

  Scheda informativa: Testa compatta per sonde RTP20

  RTP20 è una testa a basso costo con le stesse funzioni di una testa motorizzata e con una sonda a contatto TP20 integrata.

  [178kB]
• Flyer: RUP1 ultrasonic probe for REVO-2
  

  Flyer: RUP1 ultrasonic probe for REVO-2

  The RUP1 ultrasonic probe increases the multi-sensor capability of the REVO® 5-axis measurement system for CMMs, offering ultrasonic thickness inspection.

  [425kB]
• Scheda informativa: Sonda di visione RVP per REVO-2 [it]
  

  Scheda informativa: Sonda di visione RVP per REVO-2

  RVP espande la gamma di applicazioni per il sistema REVO-2 con un sensore per il rilevamento senza contatto che può essere sostituito automaticamente con le altre sonde REVO. In questo modo, il sistema diventa lo strumento ideale per la misura di più elementi e per l'ispezione di componenti molto diversi fra loro.

  [2.7MB]
• Flyer: ACM angle change mirror for RVP REVO vision probe
  

  Flyer: ACM angle change mirror for RVP REVO vision probe

  No description available

  [700kB]
• Leaflet: SCP600 stylus change port
  

  Leaflet: SCP600 stylus change port

  The stylus change port (SCP600) is a modular system, designed to allow automatic stylus changing on a CMMs, for the SP600 analogue probe.

  [148kB]
• Data sheet: SFM-A1 (H-1000-2290)
  

  Data sheet: SFM-A1 (H-1000-2290)

  Enhanced access and inspection capability for integrated surface finish measurement

  [175kB]
• Data sheet: SFM-A2 (H-1000-2291)
  

  Data sheet: SFM-A2 (H-1000-2291)

  Enhanced access and inspection capability for integrated surface finish measurement

  [197kB]
• Data sheet: SFM-B1 (H-1000-2295)
  

  Data sheet: SFM-B1 (H-1000-2295)

  Enhanced access and inspection capability for integrated surface finish measurement

  [164kB]
• Data sheet: SFM-B2 (H-1000-2296)
  

  Data sheet: SFM-B2 (H-1000-2296)

  Enhanced access and inspection capability for integrated surface finish measurement.

  [204kB]
• Data sheet: SFM-B3 (H-1000-2297)
  

  Data sheet: SFM-B3 (H-1000-2297)

  Enhanced access and inspection capability for integrated surface finish measurement

  [166kB]
• Data sheet: SFM-B4 (H-1000-2298)
  

  Data sheet: SFM-B4 (H-1000-2298)

  Enhanced access and inspection capability for integrated surface finish measurement

  [200kB]
• Data sheet: SFM-B5
  

  Data sheet: SFM-B5

  Enhanced access and inspection capability for integrated surface finish measurement

  [187kB]
• Data sheet: SFM-C3 (H-1000-2129)
  

  Data sheet: SFM-C3 (H-1000-2129)

  Enhanced access and inspection capability for integrated surface finish measurement

  [163kB]
• Data sheet: SFM-D1 (H-1000-2305)
  

  Data sheet: SFM-D1 (H-1000-2305)

  Enhanced access and inspection capability for integrated surface finish measurement

  [163kB]
• Data sheet: SFM-E1 (H-1000-2310)
  

  Data sheet: SFM-E1 (H-1000-2310)

  Enhanced access and inspection capability for integrated surface finish measurement

  [160kB]
• Data sheet: SFM-E2 (H-1000-2311)
  

  Data sheet: SFM-E2 (H-1000-2311)

  Enhanced access and inspection capability for integrated surface finish measurement

  [164kB]
• Data sheet: SFM-G1 (H-1000-2131)
  

  Data sheet: SFM-G1 (H-1000-2131)

  Enhanced access and inspection capability for integrated surface finish measurement

  [162kB]
• Data sheet: SFM-H1 (H-1000-2132)
  

  Data sheet: SFM-H1 (H-1000-2132)

  Enhanced access and inspection capability for integrated surface finish measurement

  [170kB]
• Scheda informativa: Sonda SFP2 per finiture superficiali [it]
  

  Scheda informativa: Sonda SFP2 per finiture superficiali

  La sonda SFP2 accresce la capacità di REVO® di misurare la finitura superficiale. Il sistema include una funzione multisensore che consente di effettuare misure punto-punto, a scansione e di visione senza contatto ad alta velocità con una sola macchina di misura.

  [264kB]
• Flyer: Calibration and capability artefacts for SFP2 surface finish probe
  

  Flyer: Calibration and capability artefacts for SFP2 surface finish probe

  Surface finish measurement has traditionally involved the use of hand-held sensors or has required the part to be moved onto a costly dedicated measuring machine. The SFP2 probe for the REVO® 5-axis system changes all this, making surface finish inspection an integral part of CMM measurement, enabling the automatic switching between scanning, optical non-contact and surface finish measurement probe types.

  [606kB]
• Leaflet: SH80K - for SP80 probes supplied before Oct 2007
  

  Leaflet: SH80K - for SP80 probes supplied before Oct 2007

  SH80K installation leaflet for SP80 probes supplied before Oct 2007

  [333kB]
• Scheda informativa: SP25M, il sistema di scansione più compatto e versatile al mondo [it]
  

  Scheda informativa: SP25M, il sistema di scansione più compatto e versatile al mondo

  Un nuovo componente della famiglia SP25 incrementa il campo delle applicazioni

  [198kB]
• Flyer: SP600Q in-quill scanning probe
  

  Flyer: SP600Q in-quill scanning probe

  SP600Q in-quill scanning probe flyer

  [113kB]
• Flyer: SP80 ultra-high accuracy scanning probe
  

  Flyer: SP80 ultra-high accuracy scanning probe

  The SP80 quill mounted probe provides class-leading scanning performance, as well as the most flexible use of styli for maximum productivity.

  [267kB]
• Data sheet: SP80 ultra-high accuracy scanning probe (H-1000-2125)
  

  Data sheet: SP80 ultra-high accuracy scanning probe (H-1000-2125)

  The SP80 quill mounted probe provides class-leading scanning performance, as well as the most flexible use of styli for maximum productivity.

  [267kB]
• Leaflet: SPA2-2 / REVO E-STOP modification leaflet
  

  Leaflet: SPA2-2 / REVO E-STOP modification leaflet

  No description available

  [1.3MB]
• Data sheet: TCR20 (H-1000-1371)
  

  Data sheet: TCR20 (H-1000-1371)

  Based on the industry standard range of MCR20 rack systems, TCR20 securely stores modules for rapid automatic changing, protecting mating surfaces from any airborne contaminants within the working envelope of the machine.

  [417kB]
• Flyer: TP20 touch trigger probe system
  

  Flyer: TP20 touch trigger probe system

  TP20 touch trigger probe system flyer

  [298kB]
• Flyer: TP200 precision touch trigger probe
  

  Flyer: TP200 precision touch trigger probe

  High precision TTP with stylus module changing - The TP200 was developed for tightly toleranced workpieces, and where access to features requires long or complex stylus arrangements.

  [391kB]
• Data sheet: TP200 precision touch-trigger probe system with stylus changer (H-1000-2130)
  

  Data sheet: TP200 precision touch-trigger probe system with stylus changer (H-1000-2130)

  TP200 is an electronic probe using strain gauge technology which gives higher accuracy than kinematic touch-trigger probes. TP200 combines outstanding metrology performance with superior functionality to produce a highly versatile DCC CMM probing system with excellent productivity.

  [194kB]
• Leaflet: Trigger force gauge guide
  

  Leaflet: Trigger force gauge guide

  Trigger force is the amount of pressure applied by the helical compression spring onto the pivotal plate and bearing points to hold the stylus mount in place.

  [63kB]
• Leaflet: UCC daughtercards
  

  Leaflet: UCC daughtercards

  No description available

  [54kB]
• Data sheet: Universal datum sphere (H-1000-2250)
  

  Data sheet: Universal datum sphere (H-1000-2250)

  The Renishaw universal datum sphere enhances the performance of manual and fully automated co-ordinate measuring machines

  [323kB]
• Leaflet: Upgrade brackets and blanking plates
  

  Leaflet: Upgrade brackets and blanking plates

  This leaflet details the bracket options available when upgrading or replacing Renishaw controllers and / or probe interfaces. By using a combination of the following brackets and / or blanking panels, any combination of existing and new Renishaw product can be mounted together inside a 19 inch cabinet rack. The bracket kits shown in this leaflet are supplied with all the necessary fixtures.

  [147kB]