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SFP2 REVO surface finish probe
SFP2 surface finish (roughness) measurement system with automatic probe and module configuration changing via RCP TC-3 and RCP2 REVO-2 change ports mounted on MSR / MSR2 module change rack
SFP2 is used in conjunction with skidded modules to access bores as small as 5 mm (0.2 in) diameter- Output: Ra, RMS and raw data are returned from UCCserver to the metrology application client software using the I++ DME protocol (raw data can subsequently be presented to specialist surface analysis software packages for further detailed reporting)
- Sensor calibration involves measuring the surface finish of the calibration artefact (SFA) mounted on the MRS2 rack
- The calibration software automatically adjusts the probe output in accordance with the calibrate value of the artefact
- The SFP2 includes an integral motorised C-axis that enables surface finish measurements to be made at all required orientations around a part
Dimensions
SFP2
Change ports
NOTE: Dimensions in mm (in). Overall dimensions are to the kinematic planes.
Specifications
SFP2 probe
C-axis positioning accuracy | ± 0.25° |
|---|---|
C-axis rotation speed | Up to 90°/sec |
Rotational capability | A-axis (from REVO-2): +120° / -110° B-axis (from REVO-2): Infinite positioning C-axis: ± 180˚ |
Mounting (probe and holder) | Magnetised coupling |
Specification
Probe head | REVO-2 only |
|---|---|
Change rack | MRS2 recommended for full capability |
Software compatibility | UCCsuite 5.2 onwards MODUS 1.8 onwards |
Weight | SFP2 probe: 330 g SFH1 holder: 33 g SFM-A1 module: 12 g SFM-A2 module: 12 g |
Operating temperature range | +10 ˚C to +40 ˚C |
Storage temperature range | -25 ˚C to +70 ˚C |
Operating humidity | 0% to 80% (non-condensing) |
Calibration and verification artefacts | SFA1: 3.0 μm Ra sinusoid SFA2: 0.5 μm Ra sinusoid SFA3: 0.4 μm Ra sawtooth TFP: Uses LF TP20 module; PICS interface to SPA3 amplifier |
Outputs | MODUS basic: Ra, Rms(Rq) MODUS standard surface texture: Rt, R3z, Rz, Rz1max, RzDIN, RzJIS, Rseg Rp, Rv Rpm, Rvm, Rc, Rsm MODUS advanced surface texture: Rk, Rpk, Rvk, Rmr, Rmr1, Rmr2, Rpq, Rvq, Rmq, Rvoid, Rvdd, Rvddl, Rcvx, Rcvxl |
Sampling rate | 4 kHz |
SFP2 probe change system
The REVO-2 probe change system is designed to allow automatic REVO-2 probe and accessory changing on a CMM. For optimum metrology, SFP2 probes and holder / module configurations should be changed automatically using REVO-2 change ports (RCP TC-3 and RCP2). These ports are mounted on the modular rack system (MRS or MRS2).
Associated products
