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SFA surface finish artefacts
Renishaw provides a range of products that support the use of REVO® SFP2 surface finish measurement probes on CMMs.
The artefact plates are used for calibrating surface finish modules, independently verifying the calibration, checking linearity and tip condition monitoring.
Additionally, Renishaw's condition checking artefact can be used to position optical flats and calibration plates throughout the CMM volume. This may be useful in assessing a machine's capability for surface roughness measurement.
The TFP tip find probe comprises a TP20 probe with low force module. It is used to map the SFP2 probe C-axis and calibrate the geometry of module / holder configurations.
SFA artefact comparison chart
Function | Surface details | Traceability | |
SFA1*  | Used for calibrating SFM surface finish modules. | 3.0 μm Ra sinusoidal profile. Electroformed nickel surface. | UKAS calibration certificate provided. |
SFA2*  | Used for checking calibration linearity. | 0.5 μm Ra sinusoidal profile. Electroformed nickel surface. | UKAS calibration certificate provided. |
SFA3*  | Used for periodic tip condition checking. | 0.4 μm Ra saw tooth profile. Electroformed nickel surface. | UKAS calibration certificate provided. |
OFA**  | A service tool for verifying machine capability and fault finding. It houses six optical flats located within a cube and has mounting holes for additional calibration and checking artefacts. | l/20 fused silica optical flat. Diameter 50 mm. | Optical flats are supplied with calibration certificates. |
* SFA1, SFA2 and SFA3 can be fixed to an MRS2 rail, MRS2 leg or the OFA artefact. These artefacts and mounts can be supplied within comprehensive system kits or individually.
** OFA can be mounted directly to the bed of a CMM, to a fixture plate or to a universal calibration tower. The OFA is available to special order only. Contact Renishaw for availability.