Data sheets - CMM products

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• Leaflet: ACR1 / ACR3 / FCR25 port replacement
  

  Leaflet: ACR1 / ACR3 / FCR25 port replacement

  Renishaw racks allow fast repeatable exchanging of probes and styli without the need for manual intervention. This leaflet covers the replacement of ports for ACR1, ACR3 and FCR25 racks.

  [584kB]
• Leaflet: ACR3 with powered port - power supply addendum
  

  Leaflet: ACR3 with powered port - power supply addendum

  No description available

  [43kB]
• Data sheet: ACR3 autochange rack
  

  Data sheet: ACR3 autochange rack

  No description available

  [416kB]
• Data sheet: AM2 adjustment module
  

  Data sheet: AM2 adjustment module

  No description available

  [81kB]
• Leaflet: High speed communications cable wiring instructions
  

  Leaflet: High speed communications cable wiring instructions

  Instruction leaflet outlining wiring the Renishaw orange high speed communications cable

  [164kB]
• Leaflet: Renishaw sensors for FARO's Quantum Arm
  

  Leaflet: Renishaw sensors for FARO's Quantum Arm

  Leaftlet describing the benefits of the TP20 and the FARO SENSOR for use with a Quantum FARO portable arm

  [165kB]
• Leaflet: Repair leaflet: MCU E-STOP
  

  Leaflet: Repair leaflet: MCU E-STOP

  Information leaflet outlining the procedure for repairing the MCU E-STOP

  [406kB]
• Leaflet: MCU docking plate
  

  Leaflet: MCU docking plate

  No description available

  [113kB]
• Flyer: MH20 articulating probe head
  

  Flyer: MH20 articulating probe head

  MH20 is a compact, infinitely adjustable manual probe head offering maximum flexibility in probe orientation. It can be installed on new and existing measuring machines via shank mounting, and is best suited to manual CMMs.

  [67kB]
• Data sheet: MH20 and MH20i
  

  Data sheet: MH20 and MH20i

  MH20 and MH20i data sheet

  [1.3MB]
• Flyer: MH20i indexing probe head
  

  Flyer: MH20i indexing probe head

  MH20i manual indexing probe head flyer

  [308kB]
• Leaflet: User's leaflet: MRS heavy duty legs
  

  Leaflet: User's leaflet: MRS heavy duty legs

  Where an MRS installation has numerous SCP80s containing heavy stylus arrangements, or vertical stylus arrangements exceeding 190 mm, it is recommended that the optional MRS heavy duty leg kits are used to provide additional rigidity/height. These kits can be purchased separately to match the number of legs used on the MRS.

  [211kB]
• Leaflet: User's leaflet: MRS adjustable footplates
  

  Leaflet: User's leaflet: MRS adjustable footplates

  The MRS rail can be placed at different heights from the CMM’s bed by using multiple MRS legs to provide the required clearance for long styli and extension bars. By using the optional MRS adjustable footplates shown below, the MRS rail can also be placed at different positions on the CMM’s bed thereby ensuring that a maximised working volume can be achieved.

  [111kB]
• Leaflet: MRS2
  

  Leaflet: MRS2

  No description available

  [64kB]
• Flyer: PH10 PLUS motorised probe head range
  

  Flyer: PH10 PLUS motorised probe head range

  No description available

  [264kB]
• Flyer: PH10M-iQ PLUS
  

  Flyer: PH10M-iQ PLUS

  PH10M-iQ PLUS – Less time calibrating, more time measuring

  [591kB]
• Data sheet: PH20
  

  Data sheet: PH20

  PH20 is a dynamic measuring probe head which delivers a 3-fold increase in measurement throughput whilst maintaining high system accuracy.

  [906kB]
• Leaflet: PHC10-3 switch settings
  

  Leaflet: PHC10-3 switch settings

  No description available

  [88kB]
• Leaflet: PHC10-3 card
  

  Leaflet: PHC10-3 card

  Installation leaflet showing the installation of cards in to PHC10-3

  [845kB]
• Leaflet: RCP repair kit
  

  Leaflet: RCP repair kit

  No description available

  [309kB]
• Leaflet: REVO head kit
  

  Leaflet: REVO head kit

  No description available

  [173kB]
• Leaflet: REVO probe kits
  

  Leaflet: REVO probe kits

  No description available

  [317kB]
• 傳單： REVO-2 及 RSP2 測頭 [tw]
  

  傳單： REVO-2 及 RSP2 測頭

  REVO-2 是唯一能同時控制機器 3 軸和測頭座 2 旋轉軸運動的 CMM 掃描系統，並使用多種 2D 和 3D 接觸式測頭、表面粗糙度量測測頭，以及目前的非接觸式影像測頭收集工件資料。

  [470kB]
• 傳單： RSP3-1 至 RSP3-4 測頭模組 [tw]
  

  傳單： RSP3-1 至 RSP3-4 測頭模組

  RSP3 系列可在量測過程中以固定的 REVO-2 測頭座角度進行 3 軸掃描。每款測頭模組都設計在指定的測針範圍內提供最佳精度及接觸力，因此 RSH3 測針模組僅適用於各自的 RSP3 針盤。

  [367kB]
• 傳單： RSP3-6 延長測頭模組 [tw]
  

  傳單： RSP3-6 延長測頭模組

  RSP3-6 功能更強大，能進入深孔及檢測大型工件內的特徵，並提供多種針盤，適合需要筆直和曲柄延長的應用，可同時用於點觸發式和 2D 掃描應用。

  [525kB]
• Flyer: RTP20
  

  Flyer: RTP20

  The RTP20 is a compact probe head with DCC capability and integral TP20 touch-trigger probe.

  [228kB]
• 傳單： RUP1 超音波測頭 [tw]
  

  傳單： RUP1 超音波測頭

  RUP1 測頭用於執行超音波厚度量測，可提升 REVO® 5 軸三次元 量測系統的檢測能力。 與其他眾多超音波系統不同，RUP1 測頭不需要使用水槽或耦合凝膠來 確保訊號傳輸品質。相反地，它使用一種創新彈性測球，在測頭和材料之 間實現出色的耦合。因此，無需安排熟練的操作人員時刻監控螢幕來解讀 RUP1 測頭的量測資料，更無需專用浸沒水槽，以節省產線空間。

  [537kB]
• 傳單： 適用於 REVO-2 的RVP 影像測頭模組 [tw]
  

  傳單： 適用於 REVO-2 的RVP 影像測頭模組

  RVP 進一步擴展 REVO-2 系統的應用範圍，採用非接觸式邊緣偵測感測器，能夠自動與所有其他 REVO 測頭選項互換使用。因此系統能夠提供最佳工具量測多項特徵，並可檢測更多不同工件。

  [2.9MB]
• Flyer: ACM angle change mirror for RVP REVO vision probe
  

  Flyer: ACM angle change mirror for RVP REVO vision probe

  No description available

  [700kB]
• Leaflet: SCP600 stylus change port
  

  Leaflet: SCP600 stylus change port

  The stylus change port (SCP600) is a modular system, designed to allow automatic stylus changing on a CMMs, for the SP600 analogue probe.

  [148kB]
• Data sheet: SFM-A1
  

  Data sheet: SFM-A1

  Enhanced access and inspection capability for integrated surface finish measurement

  [175kB]
• Data sheet: SFM-A2
  

  Data sheet: SFM-A2

  Enhanced access and inspection capability for integrated surface finish measurement

  [197kB]
• Data sheet: SFM-B1
  

  Data sheet: SFM-B1

  Enhanced access and inspection capability for integrated surface finish measurement

  [164kB]
• Data sheet: SFM-B2
  

  Data sheet: SFM-B2

  Enhanced access and inspection capability for integrated surface finish measurement.

  [204kB]
• Data sheet: SFM-B3
  

  Data sheet: SFM-B3

  Enhanced access and inspection capability for integrated surface finish measurement

  [166kB]
• Data sheet: SFM-B4
  

  Data sheet: SFM-B4

  Enhanced access and inspection capability for integrated surface finish measurement

  [200kB]
• Data sheet: SFM-B5
  

  Data sheet: SFM-B5

  Enhanced access and inspection capability for integrated surface finish measurement

  [187kB]
• Data sheet: SFM-C3
  

  Data sheet: SFM-C3

  Enhanced access and inspection capability for integrated surface finish measurement

  [163kB]
• Data sheet: SFM-D1
  

  Data sheet: SFM-D1

  Enhanced access and inspection capability for integrated surface finish measurement

  [163kB]
• Data sheet: SFM-E1
  

  Data sheet: SFM-E1

  Enhanced access and inspection capability for integrated surface finish measurement

  [160kB]
• Data sheet: SFM-E2
  

  Data sheet: SFM-E2

  Enhanced access and inspection capability for integrated surface finish measurement

  [164kB]
• Data sheet: SFM-G1
  

  Data sheet: SFM-G1

  Enhanced access and inspection capability for integrated surface finish measurement

  [162kB]
• Data sheet: SFM-H1
  

  Data sheet: SFM-H1

  Enhanced access and inspection capability for integrated surface finish measurement

  [170kB]
• 傳單： SFP2 表面粗糙度測頭 [tw]
  

  傳單： SFP2 表面粗糙度測頭

  SFP2 測頭可提升 REVO® 系統的表面粗糙度量測能力，其中具備多感測器功能，可為單一 CMM 提供接觸式高速掃描，以及非接觸式影像量測功能。

  [384kB]
• 傳單： 適用 SFP2 表面粗糙度測頭模組的校正及功能標準件 [tw]
  

  傳單： 適用 SFP2 表面粗糙度測頭模組的校正及功能標準件

  傳統的表面粗糙度量測都要使用手持感測器，或必須將工件移至昂貴的專用量測機器上。而適用 REVO® 5 軸系統的 SFP2 測頭模組改變了這一切，讓表面粗糙度檢測成為 CMM 量測不可或缺的一部分，並可自動切換使用掃描、光學非接觸式及表面粗糙度量測的測頭類型。

  [708kB]
• Leaflet: SH80K - for SP80 probes supplied before Oct 2007
  

  Leaflet: SH80K - for SP80 probes supplied before Oct 2007

  SH80K installation leaflet for SP80 probes supplied before Oct 2007

  [333kB]
• Flyer: SP25M compact scanning probe system
  

  Flyer: SP25M compact scanning probe system

  New additions to the SP25 family enhance the range of applications The SP25M is two sensors in one, and has unrivalled flexibility due to the system’s modularity. Users can scan for form, position, and size but also take high accuracy discrete points by using a dedicated scanning module or, alternatively, use an adaptor to carry Renishaw’s TP20 range of touch‑trigger probe modules.

  [361kB]
• Flyer: SP600Q in-quill scanning probe
  

  Flyer: SP600Q in-quill scanning probe

  SP600Q in-quill scanning probe flyer

  [113kB]
• Flyer: SP80 ultra-high accuracy scanning probe
  

  Flyer: SP80 ultra-high accuracy scanning probe

  The SP80 quill mounted probe provides class-leading scanning performance, as well as the most flexible use of styli for maximum productivity.

  [267kB]
• Data sheet: SP80 ultra-high accuracy scanning probe
  

  Data sheet: SP80 ultra-high accuracy scanning probe

  The SP80 quill mounted probe provides class-leading scanning performance, as well as the most flexible use of styli for maximum productivity.

  [267kB]
• Leaflet: SPA2-2 / REVO E-STOP modification leaflet
  

  Leaflet: SPA2-2 / REVO E-STOP modification leaflet

  No description available

  [1.3MB]
• Data sheet: TCR20
  

  Data sheet: TCR20

  TCR20 module change rack for PH20

  [417kB]
• Flyer: TP20 touch trigger probe system
  

  Flyer: TP20 touch trigger probe system

  TP20 touch trigger probe system flyer

  [298kB]
• Flyer: TP200 precision touch trigger probe
  

  Flyer: TP200 precision touch trigger probe

  High precision TTP with stylus module changing - The TP200 was developed for tightly toleranced workpieces, and where access to features requires long or complex stylus arrangements.

  [391kB]
• Data sheet: TP200 precision touch-trigger probe system with stylus changer
  

  Data sheet: TP200 precision touch-trigger probe system with stylus changer

  No description available

  [194kB]
• Leaflet: Trigger force gauge guide
  

  Leaflet: Trigger force gauge guide

  Trigger force is the amount of pressure applied by the helical compression spring onto the pivotal plate and bearing points to hold the stylus mount in place.

  [63kB]
• Leaflet: UCC daughtercards
  

  Leaflet: UCC daughtercards

  No description available

  [54kB]
• Data sheet: Universal datum sphere
  

  Data sheet: Universal datum sphere

  The Renishaw universal datum sphere enhances the performance of manual and fully automated co-ordinate measuring machines

  [323kB]
• Leaflet: Upgrade brackets and blanking plates
  

  Leaflet: Upgrade brackets and blanking plates

  This leaflet details the bracket options available when upgrading or replacing Renishaw controllers and / or probe interfaces. By using a combination of the following brackets and / or blanking panels, any combination of existing and new Renishaw product can be mounted together inside a 19 inch cabinet rack. The bracket kits shown in this leaflet are supplied with all the necessary fixtures.

  [147kB]