半導体

ダウンロード: 材料科学 (半導体)

• Application note: Photocurrent measurements on the inVia™ confocal Raman microscope [en]

  When light interacts with semiconducting materials it can induce electrical currents (‘photocurrents’). These currents carry information about the electronic, optical, and charge transport properties of the material. This information is complementary to that obtainable from Raman scattering, which can identify physical changes in the material properties. This application note demonstrates the capability to simultaneously collect Raman and photocurrent data using the photocurrent mapping module concurrently with an inVia Raman microscope.

  

  Application note: Photocurrent measurements on the inVia™ confocal Raman microscope

  When light interacts with semiconducting materials it can induce electrical currents (‘photocurrents’). These currents carry information about the electronic, optical, and charge transport properties of the material. This information is complementary to that obtainable from Raman scattering, which can identify physical changes in the material properties. This application note demonstrates the capability to simultaneously collect Raman and photocurrent data using the photocurrent mapping module concurrently with an inVia Raman microscope.

  [1.6MB]
• Application note: Analyse compound semiconductors with the inVia™ Raman microscope [jp]

  Over the last decade compound semiconductors have attracted a great deal of attention because they offer properties suitable for next generation devices in a wide range of application areas. Historically, the fabrication of these devices has been hindered by material challenges. While these have mainly been conquered at the research level, problems still persist when scaling up to industrial production. Renishaw’s inVia Raman microscope is a non-invasive, non-destructive characterisation tool which provides sub-micrometre information on the vibrational, crystal and electronic structure of materials.

  

  Application note: Analyse compound semiconductors with the inVia™ Raman microscope

  Over the last decade compound semiconductors have attracted a great deal of attention because they offer properties suitable for next generation devices in a wide range of application areas. Historically, the fabrication of these devices has been hindered by material challenges. While these have mainly been conquered at the research level, problems still persist when scaling up to industrial production. Renishaw’s inVia Raman microscope is a non-invasive, non-destructive characterisation tool which provides sub-micrometre information on the vibrational, crystal and electronic structure of materials.

  [643kB]
• アプリケーションノート： inVia ラマンマイクロスコープによる 炭化ケイ素（SiC）の分析

  炭化ケイ素の特性はその結晶構造（各種のポリタイプが存在）、結晶の質、内部の欠陥の数とタイプに応じて大きく変化します。炭化ケイ素の原材料とデバイスの製造業者が歩留まりを増加するためには、これらの特性をモニターしながらコントロールする必要があります。

  

  アプリケーションノート： inVia ラマンマイクロスコープによる 炭化ケイ素（SiC）の分析

  炭化ケイ素の特性はその結晶構造（各種のポリタイプが存在）、結晶の質、内部の欠陥の数とタイプに応じて大きく変化します。炭化ケイ素の原材料とデバイスの製造業者が歩留まりを増加するためには、これらの特性をモニターしながらコントロールする必要があります。

  [623kB]
• News release: Identifying imperfections with Raman spectroscopy [en]

  An article in Compound Semiconductor magazine, October 2015, describes how Raman spectroscopy allows routine mapping of SiC wafers in little more than an hour.

  

  News release: Identifying imperfections with Raman spectroscopy

  An article in Compound Semiconductor magazine, October 2015, describes how Raman spectroscopy allows routine mapping of SiC wafers in little more than an hour.

  [2.2MB]