Renishaw introduces new Particle Analysis module

October 2020

Renishaw introduces new Particle Analysis module

Renishaw has introduced the Particle Analysis software module for its inVia™ confocal Raman microscope. The module automates the inVia microscope so that it can identify particles on images and then chemically analyse them using Raman spectroscopy.

Renishaw's inVia Raman system has a high-quality microscope that is ideal for producing optical images of particles on surfaces. These images are used to guide Raman spectroscopy measurements that rapidly give chemically specific, high spatial-resolution information.

The software module pinpoints multiple particles for automated Raman analysis and reports the results in an easy-to-navigate format. It gives chemical information on each particle and its morphology statistics. This enables you to easily spot correlations between particle size, shape and chemistry.

The new module also works with Renishaw's Correlate™ module so that images from other microscopy systems can be used to guide Raman analyses on the inVia microscope.

The Particle Analysis module rapidly and comprehensively analyses multiple particles and can be used in many applications. David Reece, Marketing Manager for Renishaw's Spectroscopy Products Division, said “Raman spectroscopy is being used increasingly for contamination detection, forensics, pharmaceutical products and microplastic analysis. Our new module enables the full investigation and reporting of morphological and chemical properties of particles. This will enable a deeper understanding of the particles, their properties and origins.”

The Particle Analysis software is an optional module for Renishaw's WiRE™ 5.4 software, for use with the inVia confocal Raman microscope.